PRODUCT CENTER
掃描電鏡 Hitachi S-3500N
發布時間: 2018-03-22
Variable Pressure Scanning Electron Microscope, HITACHI S-3500N
- Resolution: 3 nm (high vacuum mode) or 4,5 nm (variable pressure mode)
- Magnification: 15 - 300.000
- Accelerating voltage: 0,3 - 30 Kv
- Variable pressure range: 1 - 270 Pa
- Secondary electron detector
- Robinson backscattered electron detector
- Variable pressure secondary electron detector
- X-Ray detector
- Eucentric stage with motor drive unit for 5-axes (X,Y,Z,R,T)
- Cold stage (-190oC - 60oC)
- Peltier Coolstage (-15 - +50 oC)
- High density real time image (2560 x 1920 pixels)
